Advanced Scientific Instruments is an open access, peer-reviewed international journal that provides an interdisciplinary international exchange platform for research results in the field of instrument, instrumentation and measurements. Our journal is dedicated to publishing papers that address innovative solutions to the development and use of scientific instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications.

This journal contains four sections:

Section A (the development of scientific instruments): This section focuses on Innovative design, methods, metrological characterization, and theory of all aspects of advanced instruments, including detectors, sensors, transducers, signal generators, virtual instruments and more.

Section B (photonics, laser & radar): This section focuses on new equipment and techniques for photon manipulation and detection, all photon energies, lasers, pump-probe and resonance ionization lasers, radar, radiometry, spectroscopy of all types, optical metrology and inspection and more.

Section C (imaging & microscopy): This section focuses on new advances and breakthroughs in the theory and experimental analysis methods, techniques and equipment of micro and nano metrology, surface physics, material characterization, precision measurement, real-time image analysis and synthesis systems, visualization, etc.

Section D (electronics, micro/nano technology & systems): This section focuses on the advanced theory, analytical method, experiment and application of instruments in micro- and optoelectronics and optical information technologies, microcomputer design, chip-based processes, and more.

Section E (sensing, measurement & manipulation): This section focuses on intelligent instrument for automation, quantum sensing and instruments, sensors and actuators, uncertainty, traceability and calibration, instrument control, chromatography, electrochemistry, electrophoresis, relaxation methods, thermal analysis, physical property measurements, membrane technology, and more.

Section F (data analysis tools and approaches): This section focuses on new data acquisition architectures, components, pre-processing techniques, machine learning and signal processing, artificial intelligence methods and systems, etc.