Snapshot Fourier ellipsometry: Pushing to sub-nanometer accuracy for high-throughput thin film metrology
March 2026
Fourier ellipsometry (FE) has emerged as a promising candidate for high-throughput thin-film metrology in semiconductors, addressing critical demands for inline integration with a compact design, micro-spot...
Calorimetric methods for measuring the energies of adsorbed catalytic reaction intermediates, of surface metal atoms in catalyst materials, and of surface reaction steps in other technologies
March 2026
There is tremendous motivation to know the energies of adsorbed catalytic reaction intermediates and transition states on different surfaces, for these are the factors that determine the differences...